{"id":87,"date":"2026-06-01T10:38:14","date_gmt":"2026-06-01T10:38:14","guid":{"rendered":"https:\/\/khkrh7q1ur.wpdns.site\/product\/mccb-long-time-thermal-calibration-bench\/"},"modified":"2026-06-09T03:50:01","modified_gmt":"2026-06-09T03:50:01","slug":"mccb-long-time-thermal-calibration-bench-product","status":"publish","type":"product","link":"https:\/\/benlongkj.com\/vi\/san-pham\/mccb-long-time-thermal-calibration-bench-product\/","title":{"rendered":"B\u00e0n hi\u1ec7u chu\u1ea9n nhi\u1ec7t l\u00e2u d\u00e0i MCCB"},"content":{"rendered":"
\n
\n
\n
Long\u2011time overload \u00b7 High\u2011stability current<\/div>\n

High\u2011Stability MCCB Long\u2011Time Thermal Calibration Test Bench<\/h1>\n

C\u00e1i n\u00e0y B\u00e0n hi\u1ec7u chu\u1ea9n nhi\u1ec7t l\u00e2u d\u00e0i MCCB<\/strong> is an essential solution for verifying and adjusting the thermal trip characteristics of molded case circuit breakers. Designed for continuous, high\u2011current operation (up to 500A or higher per station), it accurately simulates real\u2011world overload conditions, allowing manufacturers to calibrate the breaker\u2019s trip curve for optimal overload protection. The system integrates high\u2011stability current sources (drift <2% over 8 hours<\/span>), precise temperature monitoring, and automated data logging for full traceability.<\/p>\n

Key capabilities include programmable test currents (e.g., 100% In, 135% In), multiple independent test stations, and real\u2011time trip time measurement with \u00b10.1% accuracy. The bench supports MCCB frames from 100A to 800A (customizable up to 1600A) and 1P\u20114P configurations. An optional environmental chamber maintains consistent ambient temperature for even more repeatable results. All test results are automatically recorded and can be exported to MES for quality audits. Ideal for MCCB manufacturing QC, certification labs, and routine production sampling.<\/p>\n

Standard delivery: 45-60 days | Current stability <2% drift | Multi\u2011station parallel testing<\/span><\/p>\n<\/p><\/div>\n

\n \"MCCB<\/p>\n
Long\u2011time thermal calibration station (actual product)<\/div>\n<\/p><\/div>\n<\/p><\/div>\n
\n

What is an MCCB Long\u2011Time Thermal Calibration Bench?<\/h2>\n

M\u1ed8T MCCB long\u2011time thermal calibration bench<\/strong> is a specialized test system used to verify and adjust the overload (thermal) trip characteristic of molded case circuit breakers. The thermal trip unit uses a bimetal strip that bends under prolonged overcurrent. This bench applies stable, programmable test currents (e.g., 100% of rated current to ensure no trip, then 135% to verify trip within the required time window) and measures trip time with high accuracy. Unlike simple go\/no\u2011go testers, it also allows operators to adjust the bimetal position via a screw mechanism, re\u2011test, and confirm correct calibration. The bench typically includes multiple independent test positions, a high\u2011stability constant current source, and data logging software. It is essential for IEC 60947\u20112 compliance (clause on overload protection) and is used in MCCB manufacturing plants, quality control labs, and certification bodies. As a non\u2011standard custom solution<\/strong>, we tailor the bench to your MCCB frame sizes, current ratings, and production volume.<\/p>\n

\n
\n High\u2011stability current source<\/strong>
\n Drift <2% over 8 hours, THD <3%, accuracy \u00b11% of reading.\n <\/div>\n
\n Multi\u2011station parallel testing<\/strong>
\n Test multiple MCCBs simultaneously (4\u201116 positions) for high throughput.\n <\/div>\n
\n Programmable test currents<\/strong>
\n 100%, 135%, 150%, or custom values per IEC 60947\u20112.\n <\/div>\n
\n Automated data logging<\/strong>
\n Records trip time, test current, ambient temperature, and pass\/fail status.\n <\/div>\n<\/p><\/div>\n<\/p><\/div>\n
\n

Key Features & Calibration Process<\/h2>\n
\n
\n \"Intelligence<\/p>\n
T\u00ecnh b\u00e1o & Kh\u1ea3 n\u0103ng quan s\u00e1t<\/div>\n<\/p><\/div>\n
\n \"Efficiency<\/p>\n
Hi\u1ec7u qu\u1ea3 v\u00e0 t\u00ednh b\u1ec1n v\u1eefng<\/div>\n<\/p><\/div>\n
\n \"Design<\/p>\n
Thi\u1ebft k\u1ebf & T\u00edch h\u1ee3p<\/div>\n<\/p><\/div>\n
\n \"Safety<\/p>\n
An to\u00e0n & \u0110\u1ed9 tin c\u1eady<\/div>\n<\/p><\/div>\n<\/p><\/div>\n<\/p><\/div>\n

Th\u00f4ng s\u1ed1 k\u1ef9 thu\u1eadt<\/h2>\n
High\u2011stability thermal calibration bench for MCCB overload testing. Multiple test positions, programmable current, automated data logging. Customizable for various frame sizes.<\/div>\n
\n\n\n\n\n\n\n\n\n\n\n\n\n
Supported MCCB frames<\/th>\n100A \u2013 800A (standard); custom up to 1600A<\/span> —
\n <\/tr>\n
S\u1ed1 l\u01b0\u1ee3ng tr\u1ea1m ki\u1ec3m tra<\/th>\n4, 8, 12, or 16 independent positions (customizable)<\/span>—
\n <\/tr>\n
Test current range<\/th>\nUp to 500A per station (expandable)<\/span>—
\n <\/tr>\n
\u0110\u1ed9 ch\u00ednh x\u00e1c hi\u1ec7n t\u1ea1i<\/th>\n\u00b11% of reading, stability <2% drift over 8 hours<\/span>—
\n <\/tr>\n
Timing resolution<\/th>\n0.01s (standard), accuracy \u00b10.1% of reading<\/span>—
\n <\/tr>\n
C\u00e1c lo\u1ea1i b\u00e0i ki\u1ec3m tra<\/th>\nNo\u2011trip at 100% In, trip at 135% In (or 150% In by IEC 60947\u20112)<\/span>—
\n <\/tr>\n
Data logging<\/th>\nTrip time, test current, ambient temperature, pass\/fail per station<\/span>—
\n <\/tr>\n
Cooling system<\/th>\nForced air cooling between tests to ensure repeatability<\/span>—
\n <\/tr>\n
H\u1ec7 th\u1ed1ng \u0111i\u1ec1u khi\u1ec3n<\/th>\nPLC (Siemens\/Mitsubishi) v\u1edbi HMI, l\u01b0u tr\u1eef c\u00f4ng th\u1ee9c cho h\u01a1n 20 lo\u1ea1i s\u1ea3n ph\u1ea9m.<\/span>—
\n <\/tr>\n
Ngu\u1ed3n \u0111i\u1ec7n<\/th>\n380V \u00b110% 50Hz | Three\u2011phase, heavy\u2011duty<\/span>—
\n <\/tr>\n<\/tbody>\n<\/table><\/div>\n

\u01afu \u0111i\u1ec3m k\u1ef9 thu\u1eadt c\u1ed1t l\u00f5i<\/h2>\n
\n
\n

Exceptionally stable current over long tests<\/h4>\n

The bench\u2019s closed\u2011loop current control (IGBT or thyristor) maintains set current within \u00b12% even after 8 hours of continuous operation \u2013 critical for long\u2011time tests that can last 1\u20118 hours. Waveform distortion below 3% ensures accurate bimetal heating.\n <\/p><\/div>\n

\n

Parallel testing maximizes throughput<\/h4>\n

With 8 independent stations, you can calibrate 8 MCCBs simultaneously. Each station has its own current source, timer, and pass\/fail indication. Bottlenecks are eliminated, and per\u2011unit test time is drastically reduced.\n <\/p><\/div>\n

\n

Automatic trip detection & adjustment assistance<\/h4>\n

Sensors detect the exact moment the breaker trips. The HMI displays trip time and compares it to the acceptable window. For adjustable breakers, we can integrate a stepper motor to automatically turn the calibration screw \u2013 forming a fully automatic calibration loop.\n <\/p><\/div>\n

\n

Temperature compensation for consistent results<\/h4>\n

Ambient temperature affects bimetal trip time. The bench monitors temperature and can automatically adjust acceptance windows or test currents to compensate. An optional environmental chamber maintains 25\u00b0C \u00b13\u00b0C for lab\u2011grade tests.\n <\/p><\/div>\n<\/p><\/div>\n

<\/p>\n

\n \u0110\u01b0\u1ee3c c\u00e1c nh\u00e0 l\u00e3nh \u0111\u1ea1o ng\u00e0nh tin t\u01b0\u1edfng<\/span><\/p>\n
\n
\n \"ABB\"\n <\/div>\n
\n \"DELIXI\"\n <\/div>\n
\n \"EKF\"\n <\/div>\n
\n \"KRIPAL\"\n <\/div>\n
\n \"HPL\"\n <\/div>\n
\n \"CHAC\"\n <\/div>\n
\n \"Schneider\"\n <\/div>\n
\n \"IEK\n <\/div>\n
\n \"SUNIR\"\n <\/div>\n
\n \"Bevone\"\n <\/div>\n
\n \"Weg\"\n <\/div>\n
\n \"HUYU\"\n <\/div>\n
\n \"RAAD\"\n <\/div>\n
\n \"WALTONE\"\n <\/div>\n
\n \"HAVELLS\"\n <\/div>\n
\n \"C&S\n <\/div>\n<\/p><\/div>\n<\/p><\/div>\n
\n

Customer Success Story \u2013 MCCB Manufacturer<\/h3>\n

A Brazilian MCCB manufacturer was experiencing inconsistent long\u2011time trip results due to unstable test currents. Their old bench had current drift >5% over 1 hour, causing false failures and rework. Benlong replaced it with an 8\u2011station long\u2011time thermal calibration bench featuring closed\u2011loop current control (<1% drift over 8 hours). Results after 3 months:<\/p>\n

\n
N\u0103ng su\u1ea5t l\u1ea7n \u0111\u1ea7u<\/strong> 98% (up from 85%)<\/div>\n
+200%<\/strong> Throughput (parallel 8 stations)<\/div>\n
70%<\/strong> Reduction in operator time<\/div>\n<\/p><\/div>\n

The bench paid for itself in 8 months and helped the customer pass an IEC audit with complete traceability records.<\/p>\n<\/p><\/div>\n

\u1ee8ng d\u1ee5ng v\u00e0 t\u00edch h\u1ee3p<\/h2>\n
\n
\n
Ki\u1ec3m so\u00e1t ch\u1ea5t l\u01b0\u1ee3ng s\u1ea3n xu\u1ea5t MCCB<\/strong> \u2013 Routine long\u2011time calibration on production lines<\/div>\n
Type test laboratories<\/strong> \u2013 Certification testing per IEC 60947\u20112<\/div>\n
Ki\u1ec3m tra \u0111\u1ea7u v\u00e0o<\/strong> \u2013 Verifying purchased MCCBs meet trip curves<\/div>\n
R&D validation<\/strong> \u2013 Characterizing new bimetal designs<\/div>\n<\/p><\/div>\n<\/p><\/div>\n

Custom Engineering & Delivery<\/h2>\n
\n
1. Ph\u00e2n t\u00edch y\u00eau c\u1ea7u<\/strong> 10-20 days \u00b7 MCCB samples, test current specs<\/div>\n
2. Current source & station design<\/strong> 15-30 days \u00b7 number of stations, cooling system<\/div>\n
3. S\u1ea3n xu\u1ea5t<\/strong> 45-60 ng\u00e0y<\/div>\n
4. Pre\u2011FAT<\/strong> T\u1ea1i nh\u00e0 m\u00e1y Benlong<\/div>\n
5. Installation & training<\/strong> On-site 5\u20117 days<\/div>\n
6. B\u00e0i ki\u1ec3m tra SAT cu\u1ed1i k\u1ef3<\/strong> 5\u20117 days \u00b7 acceptance report<\/div>\n<\/p><\/div>\n
\n

Request a Custom MCCB Long\u2011Time Calibration Bench Quote<\/h2>\n

Send us your MCCB specifications (frame sizes, rated currents, test volume). Our engineers will design a bench with the optimal number of stations, current range, and data logging features \u2013 including a full ROI analysis.<\/p>\n

Li\u00ean h\u1ec7 ngay<\/a><\/p>\n

WhatsApp: +86 150 5837 0007 | Email: xsb@benlongkj.cn | English & Chinese support<\/p>\n<\/p><\/div>\n

\n
\n

Why Choose Benlong for MCCB Calibration Benches?<\/h3>\n